Traditional RF testing and high/low temperature testing are separate tests. The chamber only verifies the radiation performance at normal temperature, while high/low temperature testing is conducted test method. There is a lack of testing for the overall air interface performance at high/low temperatures.
Our high and low temperature series products achieve a perfect combination of temperature control and chamber, providing highly reliable, accurate, and repeatable wireless device air performance measurement data in accurately simulated extreme temperature environments. Its performance indicators meet the technical requirements of the national standard GB10592-89 high and low temperature test box, and its shielding performance also meets the relevant requirements of the national standard GB12190, providing excellent high and low temperature air interface environment simulation for communication equipment.